2020-10-01
                                Quality of data measurements in the big data era: Lessons learned from MIDAS project
                                
                                                                                                                                                                                                                            Gorka Epelde Unanue
                                                                                                                                                                                                
                                                                                                                                                                                                Roberto Álvarez Sánchez
                                                                                                                                                                                                Mónica Arrúe
                                                                                                                                                                                                Iker Ezkerra
                                                                                                                                                                                                Oihana Belar
                                                                                                                                                                                                Roberto Bilbao
                                                                                                                                                                                                Gorana Nikolic
                                                                                                                                                                                                Xi Shi
                                                                                                                                                                                                Bart De Moor
                                                                                                                                                                                                Maurice Mulvenna
                                                                                                                                                                                                        
                                IEEE Instrumentation & Measurement Magazine